@INPROCEEDINGS{SMST16, 
author={W. Schoenmaker and P. Meuris and C. Strohm and C. Tischendorf}, 
booktitle={2016 Design, Automation Test in Europe Conference Exhibition (DATE)}, 
title={Holistic coupled field and circuit simulation}, 
year={2016}, 
pages={307-312}, 
keywords={Maxwell equations;circuit simulation;electromagnetic fields;semiconductor industry;3D electromagnetic field model;Maxwell equation;circuit simulation;holistic coupled field;holistic simulation approach;lumped circuit model;lumped element model;mutual electromagnetic influence;semiconductor industry;Charge carrier processes;Current density;Electric potential;Electromagnetic fields;Integrated circuit modeling;Mathematical model;Voltage control}, 
month={March},}